AHMAD RADZI, Syafeeza. Automated X-Ray Inspection (AXI) on Surface Mount Technology Resistor (SMT-Res) Defects Detection Using GAN-YOLOv8n Model. International Journal of Integrated Engineering, [S. l.], v. 16, n. 9, p. 339–350, 2024. Disponível em: https://penerbit.uthm.edu.my/ojs/index.php/ijie/article/view/15519. Acesso em: 9 apr. 2026.