Y. Atalla, M. H. Mamat, and Y. Hashim, “Characterization and Optimization of Si-FinFET Structure Based on Gate Length and Working Temperature”, IJIE, vol. 17, no. 2, pp. 177–185, Jul. 2025, Accessed: Apr. 08, 2026. [Online]. Available: https://penerbit.uthm.edu.my/ojs/index.php/ijie/article/view/17145