Atalla, Yousif, Mohamad Hafiz Mamat, and Yasir Hashim. “Characterization and Optimization of Si-FinFET Structure Based on Gate Length and Working Temperature”. International Journal of Integrated Engineering 17, no. 2 (July 27, 2025): 177–185. Accessed April 8, 2026. https://penerbit.uthm.edu.my/ojs/index.php/ijie/article/view/17145.